Applications
High k dielectrics
Nanocoatings
Surface modification layers
Device encapsulations
Photonic crystals
Optional add-on components
Remote plasma source
Ozone delivery system
Quartz crystal monitor
Quadruple mass spectrometer
Real-time temperature monitor
Ellipsometer
LoadLock |
ALD Al2O3 film on 4 inch Si wafer
Thickness Non-Uniformity:< 1%
Leakage current <1 nA/cm at 2 MV/cm
Breakdown field: 8 -10 MV/cm
Dielectric constant of as-grown film ~ 8 |