Pyrometric Interferometry

Advanced System for Real-time Measurement of Substrate Temperature, Growth Rate, and Film Index of Refraction During MBE and MOCVD Thin Film Growth.

RHEED

State-of-the-art RHEED Image Analysis Software for Diffraction Studies, Strain Analysis, and Growth Rate Measurement to Optimize Material Quality During Deposition.

Atomic Absorption

Turn-Key System for Real-Time Flux Measurement and Composition Control During Thin Film Deposition Processes.

In-Situ Cathodoluminescence

Real-time Measurement of Composition, Optical Quality and Doping Level of Nitride and Oxide Material During Thin Film Deposition.